Sample Sidebar Module

This is a sample module published to the sidebar_top position, using the -sidebar module class suffix. There is also a sidebar_bottom position below the menu.

Sample Sidebar Module

This is a sample module published to the sidebar_bottom position, using the -sidebar module class suffix. There is also a sidebar_top position below the search.

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Contact Us: (505) 880-1856     Email: info@thetaplate.com
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Inspection and Testing

Plating Thickness & Deposit Testing X-ray fluorescence per ASTM B568-90 Atomic absorption
spectrophotometer bath analysis and environmental compliance
Complete wet lab for bath analysis and environmental compliance.

XRF Plating Coating Thickness Gauge Testing

XRF & X-ray fluorescence spectroscopy information XRF is an analytical technique that can be used to determine the chemical composition of a wide variety of sample types including solids, liquids, slurries and loose powders. XRF is also used to determine the thickness and composition of layers and coatings. It can analyse elements from beryllium (Be) to uranium (U) in concentration ranges from 100 wt% to sub-ppm levels.

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XRF is a robust technique, combining high precision and accuracy with straightforward, fast sample preparation. It can be readily automated for use in high-throughput industrial environments, plus XRF provides both qualitative and quantitative types of information on a sample. Easy combination of this ‘what?’ and ‘how much?’ information also makes rapid screening (semi-quantitative) analysis possible.

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XRF is an atomic emission method, similar in this respect to optical emission spectroscopy (OES), ICP and neutron activation analysis (gamma spectroscopy). Such methods measure the wavelength and intensity of ‘light’ (X-rays in this case) emitted by energized atoms in the sample. In XRF, irradiation by a primary X-ray beam from an X-ray tube, causes emission of fluorescent X-rays with discrete energies characteristic of the elements present in the sample.IMAG0485

More information

ELEMENTS: Atomic Numbers 22(Ti) to 83(Bi) OPTIONS: Bulk FP method (Material component analysis), Bulk Calibration method (Coating solution analysis) PRECISE: Optimum geometry provides higher sensitivity even under a micro beam, enabling higher measurement accuracy with a round 0.1 or 0.2 mm collimator.

Daedalus Teks. 
Albuquerque I.T. Support
1-888-995-1516 
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